Mr Karan Singh pursuing his Ph.D. in “VLSI Design & Technology using Artificial Intelligence and Machine Learning” from Jaypee Institute of Information Technology, Noida, India. Also, he did M.Tech. in “Microelectronics & Embedded Technology” from JIIT Noida.
He has around 8 years of teaching experience along with 1 year industrial & 3 years research experience. Presently, he is working as an Assistant Professor in the Dept. of IT at Noida Institute of Engineering and Technology, Greater Noida, India. He has published several papers in reputed refereed journals. His main research area interests are VLSI Design & Technology, Artificial Intelligence and Machine Learning etc. Also, he has qualified GATE and hands-on-experience in some Electronic Design Automation (EDA) tools; like OrCAD PSPICE, TSPICE, Synopsys HSPICE, Custom Compiler, Design Vision, Mentor Graphics Eldo etc.
Education
Microelectronics & Embedded Technology
VLSI Design & Technology using Artificial Intelligence and Machine Learning
Research
VLSI, Reliability, Artificial Intelligence, Machine Learning
Key Publications
- Karan Singh and Shruti Kalra, “A Machine Learning Based Reliability Analysis of Negative Bias Temperature Instability (NBTI) Compliant Design for Ultra Large Scale Digital Integrated Circuit” in Journal of Integrated Circuits and Systems.
- Karan Singh and Shruti Kalra, ""Performance evaluation of Near-Threshold Ultradeep Submicron Digital CMOS Circuits using Approximate Mathematical Drain Current Model,” in Institution of Electronics and Telecommunication Engineers (IETE) Journal of Research.
- Karan Singh and Shruti Kalra, ""A Machine Learning-driven Paradigm for Reliability Forecasting in Diverse Temperature Conditions and Accelerated Lifetime Testing (ALT) of 22nm Bulk CMOS and Metal Gate High-k (MGK) Technologies,” in Journal of Microelectronics Reliability.
- Karan Singh and Shruti Kalra, “Machine Learning for VLSI Computer Aided Design,” Opto-VLSI Book Taylor & Francis CRC Press.
- Karan Singh et. al. “Analysis of Negative-Bias Temperature Instability Utilizing Machine Learning Support Vector Regression for Robust Nanometer Design” in 8th International Conference on Signal Processing and Communication (ICSC).
- Karan Singh et. al. “A Comprehensive Assessment of Current Trends in Negative Bias Temperature Instability (NBTI) Deterioration” in 7th International Conference on Signal Processing and Communication (ICSC).
- Karan Singh et. al. “hardware implementation of an eco-friendly electronic voting machine” in International Conference on Green Computing and Engineering Technology, Dubai.
- Karan Singh et. al. “Enhancement of Wireless Communication Technology by Zigbee” in X international conference on multidisciplinary research.
- Karan Singh “Electromagnetic Field Theory” EMFT Book from Sun India Publication New Delhi.
Professional Distinctions
GATE Qualified